MICROELECTRONICS & DIGITAL CODDE DATABASE

WEBINAR - REPLAY OF OCTOBER 7, 2025

Programme : On July 15, 2025, the CODDE® database was enhanced with 2 new sector-specific databases, allowing EIME to further specialize in the electrotechnical fields. During this webinar, our LCA and Eco-design engineers will present the content of these 2 databases, their intended uses, and the technical advancements made by LCIE Bureau Veritas since the NégaOctet project. This webinar includes an EIME demonstration

Timeline - Part 1

00:00 - Introduction

01:44 - Presentation of LCIE Bureau Veritas and the CODDE department

04:10 - Our references and previous projects

06:18 - Database content

15:30 - Examples of use with EIME software

🔊 English subtitles are not yet available. You can download the presentation in English.

Timeline - Part 2

00:00 - Examples of use with EIME software (continued)

07:30 - Database pricing

08:54 - Conclusion

🔊 English subtitles are not yet available. You can download the presentation in English.

Speakers:

Firmin DOMON, LCA and Eco-design Engineer – LCIE Bureau Veritas

Valérie GILLET, Sales Engineer – LCIE Bureau Veritas

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The CODDE® 🏷️Microelectronics and 🏷️Digital databases are developed for the following applications: Eco-design support, Comparative or non-comparative LCA studies (ISO 14040/44, ITU L1410, ETSI 203 199, ADEME reference standards), Product Carbon Footprint Declarations (ISO 14067), Type III Product Environmental Declarations.
The CODDE® 🏷️Electrical & Electronic database covers semiconductor manufacturing with a fixed 180 nm etching technology (data fixed). The CODDE® 🏷️Microelectronic database goes further, covering etching technologies from 180 nm to 7 nm. A wide range of configurations is possible. You can set the package type, semiconductor mass, silicon chip area, number of lithography masks, and production location. Silicon losses are pre-calculated by EIME. An advanced mode is available. It allows you to modify the silicon wafer diameter and thickness, the kerf thickness, and the chip defect density.
The CODDE® 🏷️Microelectronics and 🏷️Digital databases can be tested free of charge for 30 days by contacting one of our advisors (codde@bureauveritas.com).
The CODDE® 🏷️Microelectronics and 🏷️Digital databases are designed to cover a wide range of needs thanks to their data configuration system. For one-off needs, you can submit a request to LCIE Bureau Veritas to create new data, which will then model, verify, and publish the inventories. For recurring needs, the EIME software offers an optional Database Manager interface.
The NégaOctet consortium has decided to discontinue the development and marketing of the NégaOctet database. LCIE Bureau Veritas invites EIME|NégaOctet users to switch to the EIME|CODDE package. The sector-specific databases 🏷️Microelectronics & 🏷️Digital offer substantial improvements, including: the availability of configurable data providing greater variability in results, an expanded geographic scope, a transition to EF 3.1 indicators, and a database creation and update process linked to the CODDE® database. Pricing has been adjusted to facilitate access for a wider range of users.
The CODDE® 🏷️Microelectronics and 🏷️Digital databases are verified according to the general CODDE® database process. Each data entry undergoes internal verification to check the format, completeness, and consistency of the results. We supplement these checks with sample verifications conducted by third parties. User feedback also provides valuable insights for enriching and improving the CODDE® database.
Each dataset record has its own individual documentation sheet (ILCD entry-level format) accessible from EIME. You will also find Best Practice Sheets including: industry challenges, the objectives of the CODDE® database, a detailed presentation of configurable datasets, and use cases.
The CODDE® 🏷️Microelectronics and 🏷️Digital databases are updated according to the annual CODDE® database maintenance process. This update includes, at a minimum: changes in electricity mixes according to the International Energy Agency (IEA) and the efficiency rates of semiconductor manufacturing plants.